
Specification of defect::
| Natural of Defect |
Effective area |
| Inclusion/Bubble/Pit |
40µmMax |
| Dust |
Can be blew away is acceptable |
| Scratch |
20µm Max.In width;
Invisible after rotated |
| Edge Chips |
Max.0.3mm |
| Memark |
Inspection environment: With class1000 clean room/class100clean booth and 60W bull lamp and around 15cm to objective with normal net eyes. |
Durability test:
1)Any defect shall not be found after 500hours at 85℃;
2)Any defect shall not be found after 500 hours at -20℃,
3)Any defect shall not be found after 100 cycles of test as follows:
【-20℃(30minutes)~+25℃(30 minutes)~+85℃(30 minutes)】as 1 cycle.
Package:
Packing shall be made with a container which is made of a vacuum molded conductive PVC(polyvinyl chloride)and not touch the main surface of optical low pass filter.